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If you want to buy Keyence VK-X150K , as well as order other industrial equipment and constituent parts for its mend, please contact FAMAGA United Kingdom, United States, Netherlands, Germany, France, Ireland, Bahamas, Malawi, Saudi Arabia, Armenia, Antigua and Barbuda, Lithuania, Japan, Spain, Dominica, Tonga, Slovenia, Niger, Panama, Serbia, Zambia, Kenya, Barbados, El Salvador, Denmark, South Sudan, Albania, Kazakhstan, Greece, Burkina Faso, Guinea, Togo, Ecuador, Estonia, Lesotho, Mauritania, Mauritius, Vietnam, Cameroon, Liberia, The Gambia, South Africa, Egypt, New Zealand, Malaysia, Swaziland.
We have been delivering Keyence goods all around the UK and anywhere in the world for over 11 years. All equipment and constituents are provided with appropriate quality certificates, together with a guarantee from the official creator of products Keyence.
Thanks to the direct deliveries from global European manufacturers and a minimum trade margin, we suggest our customers the most affordable prices for all products presented in our catalogue. If necessary, our qualified specialists will help you select industrial equipment that will fully meet the requirements of the production process. More than 4,000 customers have already appreciated the high quality of the goods we supply and the professionalism of the FAMAGA employees.
To clarify the price of Keyence VK-X150K and shipment time, you can complete a special inquiry form on our website, dispatch a list of necessary equipment by E-mail or call to the mentioned phone numbers. We will be able to make the best commercial offer for you and provide optimal delivery times to any urban place in the UK and any country in the world.
Model | VK-X150K | |
Total magnification | Up to 19200?*1 | |
Field of view (minimum range) | 16 to 5400 µm | |
Frame rate | Laser measurement speed | 4 to 120 Hz, 7,900 Hz*2 |
Measurement principles | Optical system | Pinhole confocal optical system |
Height measurement | Linear scale | 5 nm |
Repeatability ? | 20?: 40 nm, 50?: 20 nm, 100?: 20 nm *3 | |
Memory for Z-axis measurement | 1.4 million steps | |
Accuracy | 0.2 + L/100 µm or better*4*5 | |
Width measurement | Display resolution | 10 nm |
Repeatability 3? | 20?: 100 nm, 50?: 50 nm, 100?: 30 nm*3 | |
Accuracy | ±2%*3 | |
XY stage configuration | Manual: Operating range | 70 mm?70 mm |
Motorized: Operating range | 50 ? 50 mm, 100 ? 100 mm*6 | |
Observation | Maximum capture resolution | 3072?2304 |
Weight | Microscope | Approx. 25 kg (without sensor head, approx. 8.5 kg) |
Controller | Approx. 11 kg | |
*1 With a 23-inch monitor. *2 At maximum speed when using a combination of measurement mode/measurement quality/lens magnification. When the line scan is within a measurement pitch of 0.1 µm. *3 When measuring the reference scale with the 20? objective lens (or higher) at an ambient temperature of 20 ± 2 °C. With the exception of the VK-X120/X130 with the 100? objective lens. *4 When measuring the reference scale with the 20x objective lens (or higher) at an ambient temperature of 20 ±2 °C. With the e x ception of the VK-X120/X130 with the 100x objective lens. *5 L = Vertical measurement length in µm *6 With a motorised stage. |