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Manufacturer
Keyence
Country
Japan
Name
VK-X1000
Type
Microscope
Stock availability:
On request
Price: On request
On request
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If you want to buy Keyence VK-X1000 , as well as order other industrial equipment and replacement parts for its adjust, please contact FAMAGA United Kingdom, United States, Netherlands, Germany, France, Ireland, Eritrea, Djibouti, Fiji, Benin, Nigeria, Japan, Madagascar, Russia, Afghanistan, Costa Rica, Cameroon, The Bahamas, Niger, Sri Lanka, Iran, Angola, Comoros, Tajikistan, Zambia, Tunisia, Equatorial Guinea, New Zealand, Argentina, China, Serbia, Israel, Liechtenstein, Rwanda, Sierra Leone, Guinea-Bissau, Yemen, Malaysia, Armenia, Azerbaijan, Cuba, Bulgaria, Venezuela, Guinea, Iraq, Thailand.
We have been delivering Keyence units all over the UK and anywhere in the world for over 9 years. All equipment and parts are provided with appropriate quality certificates, together with a guarantee from the official producer of products Keyence.
Thanks to the direct deliveries from prominent European manufacturers and a minimum trade margin, we recommend our customers the most affordable prices for all products presented in our catalogue. If necessary, our qualified specialists will help you select industrial equipment that will fully meet the requirements of the production process. More than 4,000 customers have already appreciated the high quality of the units we supply and the professionalism of the FAMAGA employees.
To clarify the value of Keyence VK-X1000 and delivery terms, you can fill in a special filling form on our website, give a list of necessary equipment by E-mail or call to the mentioned phone numbers. We will be able to make the best commercial offer for you and provide optimal delivery times to any place in the UK and any country in the world.
| Model | VK-X1000 | |
| Type | controller | |
| Total magnification | Up to 28,800 x*1 | |
| Field of view (minimum range) | 11 to 7,398 µm | |
| Frame rate (laser measurement speed) | 4 to 125 Hz, 7,900 Hz*2 | |
| Measurement principle | Optical system | Pinhole confocal optical system, Focus variation |
| Light-receiving element | 16-bit sensing: photomultiplier, High-definition colour CMOS | |
| Scanning method (during general measurement and image stitching) | Automatic upper/lower limit setting, rapid laser light intensity setting (AAGII) , automatic detection and rescanning in case of poor reflection (double scan) | |
| Height measurement | Display resolution | 0.5 nm (VK-X1100) , 5 nm (VK-X1050) |
| Linear scale | ||
| Dynamic range | 16 bits | |
| Repeatability ? | Laser confocal | 20 x, 40 nm, 50 x, 12 nm (VK-X1100) 20 x, 40 nm, 50 x, 20 nm (VK-X1050) |
| Focus variation | 5 x, 500 nm, 10 x, 100 nm, 20 x, 50 nm, 50 x, 20 nm (VK-X1100) 5 x, 500 nm, 10 x, 100 nm, 20 x, 50 nm, 50 x, 30 nm (VK-X1050) | |
| Height data acquisition range | 0.7 million steps | |
| Accuracy | 0.2 + L /100 µm or better*3 | |
| Width measurement | Display resolution | 1 nm (VK-X1100) , 10 nm (VK-X1050) |
| Repeatability 3? | Laser confocal | 20 x, 100 nm, 50 x, 40 nm (VK-X1100) 20 x, 100 nm, 50 x, 50 nm (VK-X1050) |
| Focus variation | 5 x, 400 nm, 10 x, 400 nm, 20 x, 120 nm, 50 x, 50 nm (VK-X1100) 5 x, 400 nm, 10 x, 400 nm, 20 x, 120 nm, 50 x, 65 nm (VK-X1050) | |
| Accuracy | ±2 %*3 | |
| XY stage configuration | Manual: Moving range | 70 mm x 70 mm |
| Motorised: Moving range | 100 mm x 100 mm | |
| Observation | Image options | High-definition colour CMOS image 16-bit laser colour confocal image Confocal optical system with ND filter C-laser DIC image (differential interference image) |
| Illumination | Ring illumination, coaxial illumination | |
| Laser light source for measurements | Wavelength | Violet semiconductor laser, 404 nm (VK-X1100) Red semiconductor laser, 661 nm (VK-X1050) |
| Maximum output power | 1 mW | |
| Laser class | Class 2 laser product (IEC60825-1) | |
| Power supply | Power voltage | 100 to 240 VAC, 50/60 Hz |
| Current consumption | 150 VA | |
| Weight | Approx. 3.0 kg | |
| *1 23 inch full-screen display. *2 At maximum speed when using a combination of measurement mode/measurement quality/lens magnification. When the line scan is within a measurement pitch of 0.1 µm. *3 When measuring a standard sample (standard scale) with a 20 x objective lens (or higher). |
